[1]赵卫华,屠彦.AC-PDP结构对串扰的影响[J].东南大学学报(自然科学版),2005,35(3):356-360.[doi:10.3969/j.issn.1001-0505.2005.03.008]
 Zhao Weihua,Tu Yan.Investigation on cross-talk of AC-PDP[J].Journal of Southeast University (Natural Science Edition),2005,35(3):356-360.[doi:10.3969/j.issn.1001-0505.2005.03.008]
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AC-PDP结构对串扰的影响()
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《东南大学学报(自然科学版)》[ISSN:1001-0505/CN:32-1178/N]

卷:
35
期数:
2005年第3期
页码:
356-360
栏目:
电子科学与工程
出版日期:
2005-05-20

文章信息/Info

Title:
Investigation on cross-talk of AC-PDP
作者:
赵卫华 屠彦
东南大学电子工程系, 南京 210096
Author(s):
Zhao Weihua Tu Yan
Department of Electronics Engineering, Southeast University, Nanjing 210096, China
关键词:
表面放电型PDP 二维数值模拟 相邻单元 串扰
Keywords:
surface-discharge PDP two dimensional simulation adjacent pixels cross-talk
分类号:
TN136
DOI:
10.3969/j.issn.1001-0505.2005.03.008
摘要:
采用二维数值模拟的方法计算了表面放电型PDP在不同结构下相邻3个显示单元的放电过程.研究了放电过程中各单元内电子、氙谐振态浓度分布和其平均浓度随时间的变化情况.在流体模型计算基础上,采用蒙特卡罗模型对单元内大量谐振光子的辐射、捕获过程进行模拟跟踪,从而得出各放电单元内所产生谐振光子在荧光粉层上的分布.研究了放电过程中相邻单元之间的影响,结果表明,对传统条形障壁结构,单元内维持电极间距增大,放电空间高度增加会使放电串扰和发光串扰加强,Waffle型障壁结构不仅能提高放电效率,而且能有效阻止串扰的发生.
Abstract:
Two-dimensional fluid model is used to simulate adjacent pixels’ discharge process of surface-discharge plasma display panel(PDP)with different structure. Average density and density distribution of electron and resonance Xenon are presented to study the process of discharge. The distribution of photons on the phosphor layers of corresponding cells is also calculated by Monte Carlo method base on fluid model. The influences on cross-talk of adjacent pixels are studied. For conventional straight-type cell structure, cross-talk will be intensified by increasing electrode gap and height of discharge space. Waffle rib structure can prevent this and improve luminance efficiency.

参考文献/References:

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备注/Memo

备注/Memo:
作者简介: 赵卫华(1979—),男,硕士生; 屠彦(联系人),女,教授,博士生导师,tuyan@seu.edu.cn.
更新日期/Last Update: 2005-05-20