[1]周忠元,蒋全兴,张金奎,等.静电放电电流波形校准装置的研制与分析[J].东南大学学报(自然科学版),2006,36(3):366-369.[doi:10.3969/j.issn.1001-0505.2006.03.006]
 Zhou Zhongyuan,Jiang Quanxing,Zhang Jinkui,et al.Development and analysis of ESD current sensing targets[J].Journal of Southeast University (Natural Science Edition),2006,36(3):366-369.[doi:10.3969/j.issn.1001-0505.2006.03.006]
点击复制

静电放电电流波形校准装置的研制与分析()
分享到:

《东南大学学报(自然科学版)》[ISSN:1001-0505/CN:32-1178/N]

卷:
36
期数:
2006年第3期
页码:
366-369
栏目:
电气工程
出版日期:
2006-05-20

文章信息/Info

Title:
Development and analysis of ESD current sensing targets
作者:
周忠元1 蒋全兴1 张金奎1 邓凌翔2
1 东南大学机械工程学院, 南京 210096; 2 江苏省计量测试技术研究所, 南京 210007
Author(s):
Zhou Zhongyuan1 Jiang Quanxing1 Zhang Jinkui1 Deng Lingxiang2
1 College of Mechanical Engineering, Southeast University, Nanjing 210096, China
2 Jiangsu Institute of Measurement and Testing Technology, Nanjing 210007, China
关键词:
静电放电 校准装置 电流波形
Keywords:
electrostatic discharge current sensing target current waveform
分类号:
TM935.4
DOI:
10.3969/j.issn.1001-0505.2006.03.006
摘要:
根据IEC61000-4-2的要求,研制了2种不同结构形式的静电放电电流波形校准装置,对Schaffner NSG438和KeyTek MZ-15/EC型静电放电枪的电流波形进行了校准测试.经在不同电压等级和电压极性下的多次测试发现:其中一种校准装置测得的静电放电电流波形与出厂结果相吻合,即该校准装置的设计是成功的.通过试验对比和定量分析发现,校准装置的分布参数对静电放电电流波形的上升沿有显著影响.对于静电放电电流波形校准装置,仅满足标准规定的电压驻波比指标是不够的,必须对分布参数的影响予以高度重视.
Abstract:
Two electrostatic discharge(ESD)current sensing targets with different structures are developed in accordance with IEC 61000-4-2 specification. Current waveforms generated by Schaffner NSG438 and KeyTek MZ-15/EC ESD simulators are verified with the developed targets. It is shown that the waveform parameters achieved by one of the targets are consistent with the data provided by the manufacturer, which confirms the success of the design of this target. The ESD current results achieved through different targets are compared and analyzed. It is proved that the rise part of the current waveform is strongly affected by the distributed parameters of target. It is not sufficient to only meet the VSWR(voltage standing wave ratio)specification for the ESD current sensing target.

参考文献/References:

[1] International Electrotechnical Commission.IEC 61000-4-2:2001 electromagnetic compatibility(EMC):part 4-2:testing and measurement techniques:electrostatic discharge immunity test[S].Geneva,Switzerland:IEC Central Office,2002.
[2] American National Standards Institute.ANSI C63.16—1993 American national standard guide for electrostatic discharge test methodologies and criteria for electronic equipment[S].New York:the Institute of Electrical and Electronics Engineers Inc,1994.
[3] 吴红森,韩玉峰,尹伟佳.静电放电校准装置的研制[J].宇航计测技术,2000,20(1):2-13.
  Wu Hongsen,Han Yufeng,Yin Weijia.Development of calibrating apparatus for the ESD simulator[J].Journal of Astronautic Metrology and Measurement,2000,20(1):2-13.(in Chinese)
[4] 吴红森.静电放电模拟器的校准[J].安全与电磁兼容,2002(5):4-6.
  Wu Hongsen.Verification for electrostatic discharge simulator[J]. Safety and EMC,2002(5):4-6.(in Chinese)
[5] De Ketelaere W,Martens L,Braem Y,et al.Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration[C] // IEEE International Symposium on Electromagnetic Compatibility.New York:The Institute of Electrical and Electronics Engineers Inc,2000:449-452.
[6] Agilent technologies.Understanding oscilloscope frequency response and its effect on rise-time accuracy [EB/OL].(2002)[2005-07-10].http://cp.literature.agilent.com/litweb/pdf/5988-8008EN.pdf.
[7] Sroka Jan.Oscilloscope influence on the calibration uncertainty of the pulse rise time of ESD simulators[C] // IEEE International Symposium on Electromagnetic Compatibility.New York:The Institute of Electrical and Electronics Engineers Inc,2003:378-381.
[8] Li Huadong.Key factors affecting ESD current waveform [C] // IEEE International Symposium on Electromagnetic Compatibility.New York:The Institute of Electrical and Electronics Engineers Inc,2003:382-385.
[9] Centola Federico,Pommerenke David,Wang Kai,et al.ESD excitation model for susceptibility study [C] //IEEE International Symposium on Electromagnetic Compatibility.New York:The Institute of Electrical and Electronics Engineers Inc,2003:58-63.

备注/Memo

备注/Memo:
基金项目: 国家自然科学基金资助项目(50277007).
作者简介: 周忠元(1972—),男,博士生,副教授,emclab@seu.edu.cn; 蒋全兴(联系人),男,教授,博士生导师,qxjiang@seu.edu.cn.
更新日期/Last Update: 2006-05-20