[1]胡晨,张哲,史又华,等.模拟退火算法在低功耗BIST中的应用[J].东南大学学报(自然科学版),2002,32(2):177-180.[doi:10.3969/j.issn.1001-0505.2002.02.006]
 Hu Chen,Zhang Zhe,Shi Youhua,et al.Simulated annealing algorithm applied in low power BIST scheme[J].Journal of Southeast University (Natural Science Edition),2002,32(2):177-180.[doi:10.3969/j.issn.1001-0505.2002.02.006]
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模拟退火算法在低功耗BIST中的应用()
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《东南大学学报(自然科学版)》[ISSN:1001-0505/CN:32-1178/N]

卷:
32
期数:
2002年第2期
页码:
177-180
栏目:
电路与系统
出版日期:
2002-03-20

文章信息/Info

Title:
Simulated annealing algorithm applied in low power BIST scheme
作者:
胡晨 张哲 史又华 杨军 时龙兴
东南大学国家专用集成电路系统工程技术研究中心, 南京 210096
Author(s):
Hu Chen Zhang Zhe Shi Youhua Yang Jun Shi Longxing
National ASIC System Engineering Center, Southeast University, Nanjing 210096,China
关键词:
低功耗 模拟退火 内建自测试
Keywords:
low-power consumption stimulated annealing BIST
分类号:
TN431.2
DOI:
10.3969/j.issn.1001-0505.2002.02.006
摘要:
提出了应用模拟退火算法在一定长度的测试矢量集中寻找有效测试矢量的近似最优分组,在尽量减少面积开销的同时减少有效测试矢量的个数,并且通过置入种子的方法使LFSR产生近似最优分组的矢量,因此在保障故障覆盖率的前提下达到了降低测试功耗的目的.实验表明,采用此方法可降低测试功耗70%以上,而故障覆盖率维持不变.此外,由于减少了测试矢量,测试时间也大为缩短,在实时系统中,减少测试时间尤为重要.
Abstract:
An approach to approximately optimal group test vectors in a certain length of test patterns is proposed to decrease the number of test vectors based on simulated annealing algorithm. By the scheme of reseeding, this approach makes linear feedback shift register(LFSR)generate optimized groups of vectors, so as to reduce the power consumption without any loss of fault coverage. The experiment result shows that more than 70% power consumption can be reduced while keeping the fault coverage invariable. In addition, the test time is greatly shortened with decreased number of test vectors, which is important in real time device.

参考文献/References:

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备注/Memo

备注/Memo:
基金项目: 国家自然科学基金资助项目(60176018).
作者简介: 胡晨(1967—),男,副教授,hc@seu.edu.cn.
更新日期/Last Update: 2002-03-20