[1]胡晨,张哲,史又华,等.模拟退火算法在低功耗BIST中的应用[J].东南大学学报(自然科学版),2002,32(2):177-180.[doi:10.3969/j.issn.1001-0505.2002.02.006] 　Hu Chen,Zhang Zhe,Shi Youhua,et al.Simulated annealing algorithm applied in low power BIST scheme[J].Journal of Southeast University (Natural Science Edition),2002,32(2):177-180.[doi:10.3969/j.issn.1001-0505.2002.02.006] 点击复制 模拟退火算法在低功耗BIST中的应用() 分享到： var jiathis_config = { data_track_clickback: true };

32

2002年第2期

177-180

2002-03-20

文章信息/Info

Title:
Simulated annealing algorithm applied in low power BIST scheme

Author(s):
National ASIC System Engineering Center, Southeast University, Nanjing 210096,China

Keywords:

TN431.2
DOI:
10.3969/j.issn.1001-0505.2002.02.006

Abstract:
An approach to approximately optimal group test vectors in a certain length of test patterns is proposed to decrease the number of test vectors based on simulated annealing algorithm. By the scheme of reseeding, this approach makes linear feedback shift register(LFSR)generate optimized groups of vectors, so as to reduce the power consumption without any loss of fault coverage. The experiment result shows that more than 70% power consumption can be reduced while keeping the fault coverage invariable. In addition, the test time is greatly shortened with decreased number of test vectors, which is important in real time device.

参考文献/References:

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