[1]王琦龙,李晓华,雷威,等.光点测试中的光点修复方法研究[J].东南大学学报(自然科学版),2004,34(2):194-197.[doi:10.3969/j.issn.1001-0505.2004.02.012]
 Wang Qilong,Li Xiaohua,Lei Wei,et al.Restoration of spot in precise spot measurement[J].Journal of Southeast University (Natural Science Edition),2004,34(2):194-197.[doi:10.3969/j.issn.1001-0505.2004.02.012]
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光点测试中的光点修复方法研究()
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《东南大学学报(自然科学版)》[ISSN:1001-0505/CN:32-1178/N]

卷:
34
期数:
2004年第2期
页码:
194-197
栏目:
电子科学与工程
出版日期:
2004-03-20

文章信息/Info

Title:
Restoration of spot in precise spot measurement
作者:
王琦龙 李晓华 雷威 杨晓伟 陈福朝
东南大学电子工程系, 南京 210096
Author(s):
Wang Qilong Li Xiaohua Lei Wei Yang Xiaowei Chen Fuchao
Department of Electronic Engineering, Southeast University, Nanjing 210096, China
关键词:
光点 测量 图像处理
Keywords:
spot measurement image processing
分类号:
TN141.4
DOI:
10.3969/j.issn.1001-0505.2004.02.012
摘要:
针对在荫罩式彩色CRT器件的光点测试中,金属荫罩截获阴极束电流形成荧光屏上光点图像残缺,器件测试人员因此无法了解真实光点全貌,提出了一种有效的解决方案.该方案基于微分原理,采用脉冲偏转微移动法实现电子束在小区间内的线性偏转,并同步采集屏上的光点信息,利用必要的图像处理技术,将多次采集到的残缺光点信息依次叠加,修复成为完整的原始光点.该方案应用灵活,成本低廉,修复效果较好,测量精度较高,适用于对各种尺寸彩色CRT器件性能及显示图像质量的评价.
Abstract:
An effective restoration method has been developed, which can be used to eliminate the influence of the shadow mask on the electron spot on the screen of a CRT. Observers can’t get the full information of the beam profile because of the deformed spot. Based on differential theory, a micro stepping method deflects the electron beam linearly and grabs the spot images step by step. And the intact spot image can be restored from the original deformed images. The measurement results indicate that this method is accurate enough for designers of electron guns or deflection units to analyze all kinds of experimental tubes.

参考文献/References:

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[5] 李晓华,杨晓伟,陈福朝,等.一种精确的光点测试系统[J].真空科学与技术,2001,21(2):140-142.
  Li Xiaohua,Yang Xiaowei,Chen Fuchao,et al.An improved spot measurement system [J].Journal of Vacuum Science and Technology, 2001,21(2):140-142.(in Chinese)
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备注/Memo

备注/Memo:
作者简介: 王琦龙(1976—),男,博士生; 李晓华(联系人),男,教授,博士生导师, lxh@seu.edu.cn.
更新日期/Last Update: 2004-03-20